HOME > Presentation > DetailTwo-dimensional Gaussian Fitting for Accurate Lattice Constant Measurement from Selected Area Diffraction Mapベカレビッチ ラマン, 三石 和貴, 大西 剛, 上杉 文彦, 竹口 雅樹, Y. Inaguma, 大野 隆央, 高田 和典. EDGE 2017: Enhanced Data Generated by Electrons. 8th Internation. May 14, 2017-May 19, 2017.NIMS author(s)MITSUISHI, KazutakaOHNISHI, TsuyoshiUESUGI, FumihikoTAKEGUCHI, MasakiTAKADA, KazunoriFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-07-29 22:50:30 +0900Updated at: 2018-06-05 14:09:25 +0900