HOME > Presentation > Detail(Bias-voltage application in hard x-ray photoelectron spectroscopy for characterization of advanced materials)山下 良之, 上田 茂典, 吉川 英樹, 知京 豊裕, 小林 啓介. the 37th International conference on Vacuum Ultraviolet and X-ra. July 11, 2010-July 16, 2010.NIMS author(s)YAMASHITA, YoshiyukiUEDA, ShigenoriYOSHIKAWA, HidekiCHIKYO, ToyohiroFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 11:34:00 +0900Updated at: 2017-07-10 20:51:28 +0900