Characterization of solution-processed In-Si-O thin-film transistors
International Conference on Solid State Devices and Materials (S. 2018.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2018-04-13 22:39:31 +0900更新時刻: 2018-06-05 14:19:45 +0900