He+ LEIS analysis combined with pulsed jet technique of gas sensing mechanism on semiconductor gas sensor surfaces
IBA&PIXE-SIMS2021. 2021.
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Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2021-12-23 15:44:51 +0900更新時刻: 2021-12-23 15:44:51 +0900