HOME > Presentation > DetailHe+ LEIS analysis combined with pulsed jet technique of gas sensing mechanism on semiconductor gas sensor surfaces鈴木 拓, 安達 裕, 大垣 武, 坂口 勲. IBA&PIXE-SIMS2021. October 11, 2021-October 15, 2021.NIMS author(s)SUZUKI, TakuADACHI, YutakaOGAKI, TakeshiSAKAGUCHI, IsaoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2021-12-23 15:44:51 +0900Updated at: 2021-12-23 15:44:51 +0900