HOME > Presentation > Detail近接場光学顕微鏡とカソードルミネッセンスによる半導体量子ドットの観察とその比較(Comparison of Cathodoluminescence and scanning near field optical microscopy for the study of semiconductor quantum dots)三井 正, 関口 隆史, 佐久間 芳樹. 2nd International Workshop on Nano-scale Spectroscopy and Nanote. November 25, 2002-November 29, 2002.NIMS author(s)MITSUI, TadashiSAKUMA, YoshikiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2017-02-14 10:59:39 +0900 Updated at: 2017-07-10 18:35:09 +0900