HOME > Presentation > DetailSi(111)-√7×√3-In 表面における静電遮蔽効果の STM 観測(STM observation of electrostatic screening effect on the Si(111)-√7×√3-In surface)吉澤 俊介, 鷺坂 恵介, 藤田 大介, 内橋 隆. 2018年日本表面真空学会学術講演会. November 19, 2018-November 21, 2018.NIMS author(s)YOSHIZAWA, ShunsukeSAGISAKA, KeisukeUCHIHASHI, TakashiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-08-11 16:53:41 +0900 Updated at: 2018-08-11 16:53:41 +0900