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Effect of Conduction Band Offset on Breakdown Voltage at SiO2/4H-SiC (000-1) studied by Hard X-ray Photoelectron Spectroscopy
79th of JSAP Autumn Meeting 2018. September 18, 2018-September 21, 2018.
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2018-07-14 16:06:38 +0900Updated at: 2018-07-14 16:06:38 +0900