The application of micro are analysis of Al-Cu junction by wavelength-dipersive EPMA equipped with a FE electron gun.
(FE-EPMAによるAl-Cu接合境界の微細組織解析)
Microscopy and Microanalysis 2006. 2006.
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作成時刻: 2017-02-14 11:06:27 +0900更新時刻: 2017-07-10 19:39:19 +0900