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| Author | MITSUISHI, Kazutaka, BEKAREVICH, Raman, OHNISHI, Tsuyoshi, UESUGI, Fumihiko, TAKEGUCHI, Masaki, Yoshiyuki Inaguma, OHNO, Takahisa, TAKADA, Kazunori. |
|---|---|
| Title | ステージスキャンとナノサイズ制限視野絞りによる 格子定数測定の精度評価 (Lattice constant measurement obtained by nano-size SA aperture and stage scan system) |
| Event name | 第73回日本顕微鏡学会学術講演会 |
| Year of publication | 2017 |
| Language | Japanese |
| External references |