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Nonalloyed Ohmic Contacts to Buried n-GaAs Appearing After Reversed Wafer Transfer Process

International Conference on Solid State Devices and Materials. September 09, 2018-September 13, 2018.

NIMS author(s)


Fulltext and dataset(s) on Materials Data Repository (MDR)


    Created at: 2018-07-14 16:06:32 +0900Updated at: 2018-07-14 16:06:32 +0900

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