Dislocation generation and propagation across the grain boundaries and seed interfaces in cast Si
Defects Recognition, Imaging and Physics in Semiconductors. 2013.
NIMS著者
Materials Data Repository (MDR)上の本文・データセット
作成時刻: 2017-01-08 03:16:33 +0900更新時刻: 2017-07-10 21:41:30 +0900