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Dislocation generation and propagation across the grain boundaries and seed interfaces in cast Si

宮村 佳児, 陳 君, プラカッシュ ロニト ロニル, イプトナー カロリン, 原田 博文, 関口 隆史.
Defects Recognition, Imaging and Physics in Semiconductors. September 15, 2013-September 19, 2013.

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    Created at: 2017-01-08 03:16:33 +0900 Updated at: 2017-07-10 21:41:30 +0900

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