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Dislocation generation and propagation across the grain boundaries and seed interfaces in cast Si
Defects Recognition, Imaging and Physics in Semiconductors. 2013.
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-01-08 03:16:33 +0900Updated at: 2017-07-10 21:41:30 +0900