HOME > 口頭発表 > 書誌詳細Direct observation of bias-dependence potential distribution in metal/HfO2 gate stack structures by operando hard x-ray photoelectron spectroscopyYAMASHITA, Yoshiyuki, CHIKYO, Toyohiro. the Fourteenth International Conference on Electronic Spectroscopy and Structure. 2018.NIMS著者山下 良之知京 豊裕Materials Data Repository (MDR)上の本文・データセット作成時刻 :2019-03-04 09:36:56 +0900 更新時刻 :2019-03-04 09:36:56 +0900