HOME > Presentation > DetailDifferent growth mechanism of SiO2 layer on various High-k films by PE-ALD using Tris(dimethylamino)silane and oxygen plasma生田目 俊秀, 井上 万里, 高橋誠, 伊藤和博, 池田 直樹, 大井 暁彦. 18th International Conference on Atomic Layer Deposition. July 29, 2018-August 01, 2018.NIMS author(s)NABATAME, ToshihideIKEDA, NaokiOHI, AkihikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-02-20 22:07:43 +0900 Updated at: 2018-06-05 14:18:23 +0900