Microscopic Effect of Nitrogen Doping on Dielectric Constant of Hf-silicate
2005 Int. Conf. on Solid State Devices and Materials (SSDM2005). 2005.
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作成時刻: 2017-02-25 01:06:47 +0900更新時刻: 2017-07-10 19:31:08 +0900