HOME > 口頭発表 > 書誌詳細Electrical and Optical Properties of Stacking Faults in 4H-SiC DevicesCHEN, Bin, SEKIGUCHI, Takashi, CHEN, Jun, Akimasa Kinoshita, Takasumi Ohyanagi, Hirofumi Matsuhata, Hajime Okumura. DRIP XIII. 2009.NIMS著者陳 君Materials Data Repository (MDR)上の本文・データセット作成時刻: 2019-03-26 03:00:45 +0900更新時刻: 2019-03-26 03:00:45 +0900
