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Electrical and Optical Properties of Stacking Faults in 4H-SiC Devices

陳斌, SEKIGUCHI, Takashi, CHEN, Jun, Akimasa Kinoshita, Takasumi Ohyanagi, Hirofumi Matsuhata, Hajime Okumura.
DRIP XIII. 2009.

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    Created at :2019-03-26 03:00:45 +0900 Updated at :2019-03-26 03:00:45 +0900

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