HOME > Presentation > DetailElectrical and Optical Properties of Stacking Faults in 4H-SiC Devices陳斌, SEKIGUCHI, Takashi, CHEN, Jun, Akimasa Kinoshita, Takasumi Ohyanagi, Hirofumi Matsuhata, Hajime Okumura. DRIP XIII. 2009.NIMS author(s)CHEN, JunFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2019-03-26 03:00:45 +0900 Updated at :2019-03-26 03:00:45 +0900