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Interface trap states at p-GaN MO(I)S capacitors with different gate dielectrics

SANG, Liwen, 任 兵, LIAO, Meiyong, KOIDE, Yasuo, SUMIYA, Masatomo,
IWN2018. 2018.

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Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2020-01-11 03:00:24 +0900Updated at: 2020-01-11 03:00:24 +0900

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