Local characterizations of quaternary AlInGaN/GaN heterostructures using TEM and HAADF-STEM | SAMURAI, NIMS Researchers Directory Service

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Local characterizations of quaternary AlInGaN/GaN heterostructures using TEM and HAADF-STEM
(III族窒化物半導体のTEM・STEM観察)

OKUNO, Hanako, TAKEGUCHI, Masaki, MITSUISHI, Kazutaka, IROKAWA, Yoshihiro, SAKUMA, Yoshiki, FURUYA, Kazuo.

The activity Report of the JS`S 141st Commitee TuP-19- TuP-19. 2007.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2022-09-05 12:02:29 +0900 Updated at: 2022-09-05 12:02:29 +0900

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