Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope
| 著者 | Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo. |
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| 掲載誌名 | Microscopy and Microanalysis 20 [S3] 376-377 |
| 出版社 | |
| 出版年 | 2014 |
| 言語 | English |
| DOI | https://doi.org/10.1017/s1431927614003602 |