HOME > その他の文献 > 書誌詳細Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron MicroscopePeng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo. Microscopy and Microanalysis 20 [S3] 376-377. 2014.https://doi.org/10.1017/s1431927614003602 NIMS著者橋本 綾子竹口 雅樹三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2020-11-20 10:43:33 +0900更新時刻: 2024-04-01 22:30:58 +0900
