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著者名Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo.
タイトルAtomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope
掲載誌名Microscopy and Microanalysis 20 [S3] 376-377
出版社Cambridge University Press (CUP)
出版年2014
言語English
DOIhttps://doi.org/10.1017/s1431927614003602
Import To Extrenal ServiceMendeley

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