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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

著者Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo.
掲載誌名Microscopy and Microanalysis 20 [S3] 376-377
出版社
出版年2014
言語English
DOIhttps://doi.org/10.1017/s1431927614003602

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