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Atomically Resolved Scanning Confocal Electron Microscopy Using a Double Aberration-corrected Transmission Electron Microscope

Peng Wang, Angus I. Kirkland, Peter D. Nellist, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuki Shimojo.
Microscopy and Microanalysis 20 [S3] 376-377. 2014.
https://doi.org/10.1017/s1431927614003602

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    Created at: 2020-11-20 10:43:33 +0900Updated at: 2024-12-12 05:09:51 +0900

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