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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2024年05月20日

68件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • HAMAOKA, Takumi, JAO, Chih-Yu, TAKEGUCHI, Masaki. Annular dark-field scanning confocal electron microscopy studied using multislice simulations. MICROSCOPY (JOURNAL OF ELECTRON MICROSCOPY). 67 [4] (2018) 232-243
  • Y.-G. So, K. Kimoto. Effect of specimen misalignment on local structure analysis using annular dark-field imaging. Journal of Electron Microscopy. 61 [4] (2012) 207-215 10.1093/jmicro/dfs045
  • W. Lee, K. Watanabe, K. Kumagai, S. Park, H. Lee, T. Yao, J. Chang, T. Sekiguchi. Cathodoluminescence study of nonuniformity in hydride vapor phase epitaxy-grown thick GaN films. Journal of Electron Microscopy. 61 [1] (2012) 25-30 10.1093/jmicro/dfr093
  • S. Kim, Y. Oshima, H. Sawada, T. Kaneyama, Y. Kondo, M. Takeguchi, Y. Nakayama, Y. Tanishiro, K. Takayanagi. Quantitative annular dark-field STEM images of a silicon crystal using a large-angle convergent electron probe with a 300-kV cold field-emission gun. Journal of Electron Microscopy. 60 [2] (2011) 109-116 10.1093/jmicro/dfq084
  • A. Hashimoto, K. Mitsuishi, M. Shimojo, Y. Zhu, M. Takeguchi. Experimental examination of the characteristics of bright-field scanning confocal electron microscopy images. Journal of Electron Microscopy. 60 [3] (2011) 227-234 10.1093/jmicro/dfr013
  • Y.-U. Heo, M. Takeguchi, K. Furuya, H.-C. Lee. Discontinuous coarsening behavior of Ni2MnAl intermetallic compound during isothermal aging treatment of Fe-Mn-Ni-Al alloys. Journal of Electron Microscopy. 59 [S1] (2010) S135-S140 10.1093/jmicro/dfq041
  • X. Yu, R.-W. Li, T. Asaka, K. Ishizuka, K. Kimoto, Y. Matsui. Relationship between magnetic domain configuration and crystallographic orientation in a colossal magnetoresistive material. Journal of Electron Microscopy. 59 [S1] (2010) S95-S100 10.1093/jmicro/dfq035
  • T. Sasaki, H. Sawada, F. Hosokawa, Y. Kohno, T. Tomita, T. Kaneyama, Y. Kondo, K. Kimoto, Y. Sato, K. Suenaga. Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun. Journal of Electron Microscopy. 59 [S1] (2010) S7-S13 10.1093/jmicro/dfq027
  • M. Mitome, K. Ishizuka, Y. Bando. Quantitativeness of phase measurement by transport of intensity equation. Journal of Electron Microscopy. 59 [1] (2010) 33-41 10.1093/jmicro/dfp046
  • T. Hara, K. Tanaka, K. Maehata, K. Mitsuda, N. Y. Yamasaki, M. Ohsaki, K. Watanabe, X. Yu, T. Ito, Y. Yamanaka. Microcalorimeter-type energy dispersive X-ray spectrometer for a transmission electron microscope. Journal of Electron Microscopy. 59 [1] (2010) 17-26 10.1093/jmicro/dfp043
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