HOME > 論文 > 書誌詳細Effect of specimen misalignment on local structure analysis using annular dark-field imagingY.-G. So, K. Kimoto. Journal of Electron Microscopy 61 [4] 207-215. 2012.https://doi.org/10.1093/jmicro/dfs045 NIMS著者木本 浩司Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 17:03:07 +0900 更新時刻: 2026-10-08 05:24:41 +0900
