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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2024年04月27日

60件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • Hideki Yoshikawa, Kazuhiro Yoshihara, Daisuke Watanabe, Hiromi Tanaka, Shigeo Tanuma. Proposal for common data transfer format for simulation softwares used in surface electron spectroscopies. Surface and Interface Analysis. 46 [10-11] (2014) 931-935 10.1002/sia.5390
  • Yasuko Kajiwara, Hideo Iwai, Noriko Kodani, Catharina T. Migita, Akira Yano, Satoka Aoyagi. Multivariate analysis and g-ogram application to ToF-SIMS data of PEG mixed model sample. Surface and Interface Analysis. 46 [12-13] (2013) 1183-1186
  • Mineharu Suzuki, Sei Fukushima, Shigeo Tanuma. Efficiency of automated peak identification with daily used commercial software for X-ray photoelectron spectra - report from VAMAS/TWA 2/A 9 project. Surface and Interface Analysis. 45 [7] (2013) 1174-1181 10.1002/sia.5245
  • H. Jin, H. Shinotsuka, H. Yoshikawa, H. Iwai, M. Arai, S. Tanuma, S. Tougaard. Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs. Surface and Interface Analysis. 45 [6] (2013) 985-992 10.1002/sia.5196
  • Juanjuan Xing, Masaki Takeguchi, Miyoko Tanaka, Yoshiko Nakayama. Redox of NiO thin film on YSZ (111) substrate. Surface and Interface Analysis. 44 [11-12] (2012) 1483-1487 10.1002/sia.4982
  • Koji Asaka, Tadachika Nakayama, Kun'ichi Miyazawa, Yahachi Saito. Study on structure of heat-treated fullerene nanowhiskers and their field electron emission characteristics. Surface and Interface Analysis. 44 [6] (2012) 780-783 10.1002/sia.3868
  • Genki Odahara, Shigeki Otani, Chuhei Oshima, Masahiko Suzuki, Tsuneo Yasue, Takanori Koshikawa. Macroscopic single-domain graphene sheet on Ni(111). Surface and Interface Analysis. 43 [12] (2011) 1491-1493 10.1002/sia.3742
  • Masaaki Kobata, Igor Píš, Hiroshi Nohira, Hideo Iwai, Keisuke Kobayashi. Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determination. Surface and Interface Analysis. 43 [13] (2011) 1632-1635 10.1002/sia.3760
  • S. Tanuma, C. J. Powell, D. R. Penn. Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range. Surface and Interface Analysis. 43 [3] (2011) 689-713 10.1002/sia.3522 Open Access
  • T. Nagatomi, S. Tanuma, K. Goto. Absolutely determined inelastic mean free paths for 300–3000 eV electrons in 10 elemental solids. Surface and Interface Analysis. 42 [10-11] (2010) 1537-1540 10.1002/sia.3570
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