HOME > 論文 > 書誌詳細Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determinationMasaaki Kobata, Igor Píš, Hiroshi Nohira, Hideo Iwai, Keisuke Kobayashi. Surface and Interface Analysis 43 [13] 1632-1635. 2011.https://doi.org/10.1002/sia.3760 NIMS著者Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 16:19:25 +0900更新時刻: 2024-03-31 14:58:44 +0900
