Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs
(REELSから誘電関数を決定する因子分析法のロバスト性の評価)

H. Jin, H. Shinotsuka, H. Yoshikawa, H. Iwai, M. Arai, S. Tanuma, S. Tougaard.

Surface and Interface Analysis 45 [6] 985-992. 2013.

https://doi.org/10.1002/sia.5196

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Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 16:53:51 +0900 更新時刻: 2026-05-25 06:34:57 +0900

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