Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs
(REELSから誘電関数を決定する因子分析法のロバスト性の評価)
NIMS author(s)
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Created at: 2016-05-24 16:53:51 +0900Updated at: 2024-03-31 12:48:31 +0900