HOME > 論文 > 書誌詳細Sample preparation of GaN-based materials on a sapphire substrate for STEM analysisH. Okuno, M. Takeguchi, K. Mitsuishi, X. J. Guo, K. Furuya. Journal of Electron Microscopy 57 [1] 1-5. 2007.https://doi.org/10.1093/jmicro/dfm034 NIMS著者竹口 雅樹三石 和貴Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:28:04 +0900更新時刻: 2024-04-01 18:11:34 +0900
