HOME > Article > DetailSample preparation of GaN-based materials on a sapphire substrate for STEM analysisH. Okuno, M. Takeguchi, K. Mitsuishi, X. J. Guo, K. Furuya. Journal of Electron Microscopy 57 [1] 1-5. 2007.https://doi.org/10.1093/jmicro/dfm034 NIMS author(s)TAKEGUCHI, MasakiMITSUISHI, KazutakaFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:28:04 +0900Updated at: 2024-05-02 04:59:18 +0900
