HOME > 論文 > 書誌詳細Growth of SiGe thin films with uniform and non-uniform Si concentration profiles on insulating substrates by high-speed continuous wave laser annealingRyo Matsumura, Satoshi Ishii, Naoki Fukata. Materials Science in Semiconductor Processing 134 106024. 2021.https://doi.org/10.1016/j.mssp.2021.106024 Open Access Elsevier BV (Publisher) NIMS著者松村 亮石井 智深田 直樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2021-06-23 03:00:20 +0900更新時刻: 2024-03-31 12:04:04 +0900