Detection of negative charge state luminescence from nitrogen vacancy centers under electron beam excitation: effects of extrinsic and intrinsic factors | 研究者総覧SAMURAI - 物質・材料研究機構 (NIMS)

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Detection of negative charge state luminescence from nitrogen vacancy centers under electron beam excitation: effects of extrinsic and intrinsic factors

Jun Chen, Chikara Shinei, Jun-ichi Inoue, Hiroshi Abe, Takeshi Ohshima, Masashi Miyakawa, Takashi Taniguchi, Takashi Sekiguchi, Tokuyuki Teraji.

Diamond and Related Materials 113071. 2025.

https://doi.org/10.1016/j.diamond.2025.113071

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Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2025-11-20 03:11:26 +0900 更新時刻: 2026-03-24 06:04:05 +0900

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