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Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test method
(REGULAR PAPERS Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test method)

Kyungjun Kim, Chulmin Choi, Youngtaek Oh, Hiroaki Sukegawa, Seiji Mitani, Yunheub Song.
Japanese Journal of Applied Physics 56 [4S] 04CN02. 2017.
https://doi.org/10.7567/jjap.56.04cn02

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    作成時刻: 2017-02-27 00:51:51 +0900更新時刻: 2024-10-10 05:22:52 +0900

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