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Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test method
(REGULAR PAPERS Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test method)

Kyungjun Kim, Chulmin Choi, Youngtaek Oh, Hiroaki Sukegawa, Seiji Mitani, Yunheub Song.

Japanese Journal of Applied Physics 56 [4S] 04CN02. 2017.

https://doi.org/10.7567/jjap.56.04cn02

NIMS author(s)

SUKEGAWA, Hiroaki

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2017-02-27 00:51:51 +0900 Updated at: 2026-11-04 05:18:58 +0900

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