HOME > 論文 > 書誌詳細Investigation of Ohmic Contact Resistance, Surface Resistance, and Channel Resistance for Hydrogen-Terminated Diamond MOSFETsJiangwei Liu, Hirotaka Ohsato, Bo Da, Yasuo Koide. IEEE Transactions on Electron Devices 69 [3] 1181-1185. 2022.https://doi.org/10.1109/ted.2022.3140699 NIMS著者劉 江偉達 博小出 康夫Materials Data Repository (MDR)上の本文・データセット作成時刻: 2022-06-16 03:13:17 +0900更新時刻: 2024-10-13 06:53:03 +0900
