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Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices

著者Nuno J. G. Couto, Davide Costanzo, Stephan Engels, Dong-Keun Ki, Kenji Watanabe, Takashi Taniguchi, Christoph Stampfer, Francisco Guinea, Alberto F. Morpurgo.
掲載誌名Physical Review X 4 [4] 041019
ISSN: 21603308
ESIでのカテゴリ: PHYSICS
出版社American Physical Society (APS)
発表年2014
言語English
DOIhttps://doi.org/10.1103/physrevx.4.041019
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