Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices

Nuno J. G. Couto; Davide Costanzo; Stephan Engels; Dong-Keun Ki; Kenji Watanabe; Takashi Taniguchi; Christoph Stampfer; Francisco Guinea; Alberto F. Morpurgo; Nuno J. G. Couto; Davide Costanzo; Stephan Engels; Dong-Keun Ki; Kenji Watanabe; Takashi Taniguchi; Christoph Stampfer; Francisco Guinea; Alberto F. Morpurgo

doi:10.1103/physrevx.4.041019

Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices

Nuno J. G. Couto, Davide Costanzo, Stephan Engels, Dong-Keun Ki, Kenji Watanabe, Takashi Taniguchi, Christoph Stampfer, Francisco Guinea, Alberto F. Morpurgo.

Physical Review X 4 [4] 041019. 2014.

https://doi.org/10.1103/physrevx.4.041019

Open Access American Physical Society (APS) (Publisher)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 17:49:57 +0900Updated at: 2024-03-29 22:53:37 +0900