Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy (Characterization and manipulation of defects in insulating hexagonal boron nitride using scanning tunneling microscopy)
Dillon Wong, Jairo Velasco, Long Ju, Juwon Lee, Salman Kahn, Hsin-Zon Tsai, Chad Germany, Takashi Taniguchi, Kenji Watanabe, Alex Zettl, Feng Wang, Michael F. Crommie.