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Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy
(Characterization and manipulation of defects in insulating hexagonal boron nitride using scanning tunneling microscopy)

著者Dillon Wong, Jairo Velasco, Long Ju, Juwon Lee, Salman Kahn, Hsin-Zon Tsai, Chad Germany, Takashi Taniguchi, Kenji Watanabe, Alex Zettl, Feng Wang, Michael F. Crommie.
掲載誌名Nature Nanotechnology 10 [11] 949-953
ISSN: 17483395, 17483387
ESIでのカテゴリ: MATERIALS SCIENCE
出版社Springer Nature
発表年2015
言語English
DOIhttps://doi.org/10.1038/nnano.2015.188
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