Characterization and manipulation of defects in insulating hexagonal boron nitride using scanning tunneling microscopy

Dillon Wong; Jairo Velasco; Long Ju; Juwon Lee; Salman Kahn; Hsin-Zon Tsai; Chad Germany; Takashi Taniguchi; Kenji Watanabe; Alex Zettl; Feng Wang; Michael F. Crommie; Dillon Wong; Jairo Velasco; Long Ju; Juwon Lee; Salman Kahn; Hsin-Zon Tsai; Chad Germany; Takashi Taniguchi; Kenji Watanabe; Alex Zettl; Feng Wang; Michael F. Crommie

doi:10.1038/nnano.2015.188

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Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy
(Characterization and manipulation of defects in insulating hexagonal boron nitride using scanning tunneling microscopy)

Dillon Wong, Jairo Velasco, Long Ju, Juwon Lee, Salman Kahn, Hsin-Zon Tsai, Chad Germany, Takashi Taniguchi, Kenji Watanabe, Alex Zettl, Feng Wang, Michael F. Crommie.

Nature Nanotechnology 10 [11] 949-953. 2015.

https://doi.org/10.1038/nnano.2015.188

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-05-24 17:54:16 +0900 更新時刻: 2026-11-01 04:53:37 +0900

Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy(Characterization and manipulation of defects in insulating hexagonal boron nitride using scanning tunneling microscopy)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Characterization and manipulation of individual defects in insulating hexagonal boron nitride using scanning tunnelling microscopy
(Characterization and manipulation of defects in insulating hexagonal boron nitride using scanning tunneling microscopy)