走査型ケルビンプローブフォース顕微鏡と電子線後方散乱回折の複合解析を用いたS45C焼鈍鋼の表面電位における結晶方位と微細組織依存性
(Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses)