走査型ケルビンプローブフォース顕微鏡と電子線後方散乱回折の複合解析を用いたS45C焼鈍鋼の表面電位における結晶方位と微細組織依存性
(Crystallographic Orientation and Microstructure Dependences of Surface Potential for Annealed S45C Steel Using Combined Scanning Kelvin Force Probe Microscopy and Electron Backscatter Diffraction Analyses)
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Created at: 2022-03-03 03:25:12 +0900Updated at: 2024-05-01 08:12:25 +0900