HOME > 論文 > 書誌詳細Detecting Real Oxygen Ions in Polycrystalline Diamond Thin Film using Secondary Ion Mass SpectrometryTsubasa Nakagawa, Isao Sakaguchi, Hajime Haneda, Naoki Ohashi, Yuichi Ikuhara. Japanese Journal of Applied Physics 46 [6A] 3391-3393. 2007.https://doi.org/10.1143/jjap.46.3391 NIMS著者坂口 勲大橋 直樹Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:17:04 +0900 更新時刻: 2026-09-28 04:42:21 +0900
