SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Detecting Real Oxygen Ions in Polycrystalline Diamond Thin Film using Secondary Ion Mass Spectrometry

Tsubasa Nakagawa, Isao Sakaguchi, Hajime Haneda, Naoki Ohashi, Yuichi Ikuhara.
Japanese Journal of Applied Physics 46 [6A] 3391-3393. 2007.
https://doi.org/10.1143/jjap.46.3391

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2016-05-24 15:17:04 +0900 Updated at: 2026-02-21 04:40:53 +0900

    ▲ Go to the top of this page