HOME > 論文 > 書誌詳細Quantitative analysis of helium by post-ionization method using femtosecond laser techniqueHisayoshi Yurimoto, Ken-ichi Bajo, Isao Sakaguchi, Taku T. Suzuki, Amy J. G. Jurewicz, Satoru Itose, Kiichiro Uchino, Morio Ishihara. Surface and Interface Analysis 48 [11] 1181-1184. 2016.https://doi.org/10.1002/sia.6119 NIMS著者坂口 勲鈴木 拓Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-12-29 22:50:50 +0900更新時刻: 2024-03-29 17:35:42 +0900
