HOME > 論文 > 書誌詳細Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topographyMingsheng Xu, Daisuke Fujita, Keiko Onishi. Review of Scientific Instruments 80 [4] 043703. 2009.https://doi.org/10.1063/1.3115182 NIMS著者大西 桂子Materials Data Repository (MDR)上の本文・データセット作成時刻: 2016-05-24 15:45:22 +0900 更新時刻: 2026-01-23 05:40:22 +0900
