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Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography

Author(s)Mingsheng Xu, Daisuke Fujita, Keiko Onishi.
Journal titleReview of Scientific Instruments 80 [4] 043703
ISSN: 00346748, 10897623
ESI category: CHEMISTRY
Publisher
Year of publication2009
LanguageEnglish
DOIhttps://doi.org/10.1063/1.3115182
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