Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography
Author(s) | Mingsheng Xu, Daisuke Fujita, Keiko Onishi. |
---|---|
Journal title | Review of Scientific Instruments 80 [4] 043703 ISSN: 00346748, 10897623 ESI category: CHEMISTRY |
Publisher | |
Year of publication | 2009 |
Language | English |
DOI | https://doi.org/10.1063/1.3115182 |
Import this reference to Mendeley | ![]() |