HOME > Article > DetailReconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topographyMingsheng Xu, Daisuke Fujita, Keiko Onishi. Review of Scientific Instruments 80 [4] 043703. 2009.https://doi.org/10.1063/1.3115182 NIMS author(s)FUJITA, DaisukeONISHI, KeikoFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:45:22 +0900Updated at: 2024-04-01 21:00:20 +0900