Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography | SAMURAI, NIMS Researchers Directory Service

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Reconstruction of atomic force microscopy image by using nanofabricated tip characterizer toward the actual sample surface topography

Mingsheng Xu, Daisuke Fujita, Keiko Onishi.

Review of Scientific Instruments 80 [4] 043703. 2009.

https://doi.org/10.1063/1.3115182

NIMS author(s)

ONISHI, Keiko

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-05-24 15:45:22 +0900 Updated at: 2025-06-16 05:43:28 +0900

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