c軸を制御したα-Fe2O3の軟X線分光測定

Kinya Kawamura; Naoya Suzuki; Takashi Tsuchiya; Shohei Yamaguchi; Masanori Ochi; Takaaki Suetsugu; Makoto Minohara; Masaki Kobayashi; Koji Horiba; Hiroshi Kumigashira; Tohru Higuchi

doi:10.7567/jjap.55.06gj04

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Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy
(c軸を制御したα-Fe2O3の軟X線分光測定)

Kinya Kawamura, Naoya Suzuki, Takashi Tsuchiya, Shohei Yamaguchi, Masanori Ochi, Takaaki Suetsugu, Makoto Minohara, Masaki Kobayashi, Koji Horiba, Hiroshi Kumigashira, Tohru Higuchi.

Japanese Journal of Applied Physics 55 [6S1] 06GJ04. 2016.

https://doi.org/10.7567/jjap.55.06gj04

NIMS著者

土屋敬志

Materials Data Repository (MDR)上の本文・データセット

作成時刻: 2016-10-26 15:43:39 +0900更新時刻: 2024-04-01 22:40:23 +0900

Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy(c軸を制御したα-Fe2O3の軟X線分光測定)

NIMS著者

Materials Data Repository (MDR)上の本文・データセット

Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy
(c軸を制御したα-Fe2O3の軟X線分光測定)