Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy

Kinya Kawamura; Naoya Suzuki; Takashi Tsuchiya; Shohei Yamaguchi; Masanori Ochi; Takaaki Suetsugu; Makoto Minohara; Masaki Kobayashi; Koji Horiba; Hiroshi Kumigashira; Tohru Higuchi; Kinya Kawamura; Naoya Suzuki; Takashi Tsuchiya; Shohei Yamaguchi; Masanori Ochi; Takaaki Suetsugu; Makoto Minohara; Masaki Kobayashi; Koji Horiba; Hiroshi Kumigashira; Tohru Higuchi

doi:10.7567/jjap.55.06gj04

Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy
(c軸を制御したα-Fe2O3の軟X線分光測定)

Kinya Kawamura, Naoya Suzuki, Takashi Tsuchiya, Shohei Yamaguchi, Masanori Ochi, Takaaki Suetsugu, Makoto Minohara, Masaki Kobayashi, Koji Horiba, Hiroshi Kumigashira, Tohru Higuchi.

Japanese Journal of Applied Physics 55 [6S1] 06GJ04. 2016.

https://doi.org/10.7567/jjap.55.06gj04

NIMS author(s)

TSUCHIYA, Takashi

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2016-10-26 15:43:39 +0900Updated at: 2024-04-01 22:40:23 +0900

Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy(c軸を制御したα-Fe2O3の軟X線分光測定)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

Electronic structure ofc-axis controlled α-Fe2O3thin film probed by soft-X-ray spectroscopy
(c軸を制御したα-Fe2O3の軟X線分光測定)