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Hydrogen infiltration into BaTiO<sub>3</sub>-based dielectrics for multi-layer ceramic capacitors under highly accelerated temperature and humidity stress test

著者Yoshito Saito, Toshimi Oguni, Tomoyuki Nakamura, Kenichi Nada, Harunobu Sano, Minako Hashiguchi, Isao Sakaguchi.
掲載誌名Japanese Journal of Applied Physics 60 [SF] SFFC02
ISSN: 13474065, 00214922
ESIでのカテゴリ: PHYSICS
出版社IOP Publishing
発表年2021
言語English
DOIhttps://doi.org/10.35848/1347-4065/ac15a7
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