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Hydrogen infiltration into BaTiO<sub>3</sub>-based dielectrics for multi-layer ceramic capacitors under highly accelerated temperature and humidity stress test

Author(s)Yoshito Saito, Toshimi Oguni, Tomoyuki Nakamura, Kenichi Nada, Harunobu Sano, Minako Hashiguchi, Isao Sakaguchi.
Journal titleJapanese Journal of Applied Physics 60 [SF] SFFC02
ISSN: 13474065, 00214922
ESI category: PHYSICS
PublisherIOP Publishing
Year of publication2021
LanguageEnglish
DOIhttps://doi.org/10.35848/1347-4065/ac15a7
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